Dr. Soumitra R. Joy, Ph.D.

Dr. Soumitra R. Joy, Ph.D.

Assistant Professor
Electrical & Computer Engineering

Education and Training:

  • Device Engineer, Intel Corporation, USA, 2020-2024
  • Ph.D. in Electrical Engineering, University of Michigan, Ann Arbor, USA, 2020
  • M.Sc. in Electrical Engineering, Bangladesh University of Engineering and Technology, Bangladesh, 2015
  • B.Sc. in Electrical Engineering, Bangladesh University of Engineering and Technology, Bangladesh, 2012
  • Lecturer, Department of Electrical & Electronic Engineering, Bangladesh University of Engineering and Technology, 2012-2015

Research Areas:

  • Electromagnetic Metamaterial
  • VLSI, High-speed Interconnect Design
  • Reliability Analysis of Solid State Device
  • Gallium Nitride Device
  • Quantum Mechanical Modeling

Selected Papers:

  1. Nayem, Suzit Hasan, Nafiz Imtiaz, Soumitra R. Joy, and Zunaid Baten, “Theoretical limit and framework of dynamic modulation in spoof surface plasmon polarition interconnects.” Optics Express, 31(18), pp. 29536-29557, 2023.
  2. Soumitra R. Joy, Mikhail Erementchouk, Hao Yu, and Pinaki Mazumder, “Spoof Plasmon Interconnects-Communications Beyond RC Limits,” IEEE Transactions on Communications, Vol. 67(1), pp. 599-610, 2019.
  3. Soumitra R. Joy, Mikhail Erementchouk, and Pinaki Mazumder, “Spoof surface plasmon resonant tunnerling mode with high quality and Purcell factors,” Physical Review B, 95(7): 075435, 2017.
  4. Soumitra R. Joy, and Farseem M. Mohammedy, “Spectral broadening and electron-photon coupling in III-V infrared detectors of low dimensional quantum confied system,” Infrared Physics & Technology, 76: 722-734, 2016.
  5. Soumitra R. Joy, K. Joshi, Ahmad Zubair, S. Bader, H.B. Wui, I. Meric, et al., “PBTI in Scaled Oxide Submicron Enhancement Mode High-K Gallium Nitride Transistors,” 2024 IEEE International Reliability Physics Symposium (IRPS), Grapevine, TX, USA, 2024, pp. 6B.1-1-6B.1-6.

Personal Website:

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